Show simple item record

dc.contributor.authorHaneel, I.en
dc.contributor.authorUdrea, Florinen
dc.contributor.authorOxley, C. H.en
dc.contributor.authorHopper, R. H.en
dc.contributor.authorAli, S.en
dc.date.accessioned2013-08-08T14:01:38Z
dc.date.available2013-08-08T14:01:38Z
dc.date.issued2010-04
dc.identifier.citationHopper, R.H. et al. (2010) Use of Carbon Micro-particles for improved IR surface temperature measurements of CMOS MEMs Devices. IOP Measurement Science and Technology, 21 (4) 045107en
dc.identifier.urihttp://hdl.handle.net/2086/8876
dc.language.isoenen
dc.titleUse of Carbon Micro-particles for improved IR surface temperature measurements of CMOS MEMs Devicesen
dc.typeArticleen
dc.identifier.doihttp://dx.doi.org/10.1088/0957-0233/21/4/045107
dc.researchgroupCentre for Electronic and Communications Engineeringen


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following Collection(s)

Show simple item record