Use of Carbon Micro-particles for improved IR surface temperature measurements of CMOS MEMs Devices

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dc.contributor.author Haneel, I. en
dc.contributor.author Udrea, Florin en
dc.contributor.author Oxley, C. H. en
dc.contributor.author Hopper, R. H. en
dc.contributor.author Ali, S. en
dc.date.accessioned 2013-08-08T14:01:38Z
dc.date.available 2013-08-08T14:01:38Z
dc.date.issued 2010-04
dc.identifier.citation Hopper, R.H. et al. (2010) Use of Carbon Micro-particles for improved IR surface temperature measurements of CMOS MEMs Devices. IOP Measurement Science and Technology, 21 (4) 045107 en
dc.identifier.uri http://hdl.handle.net/2086/8876
dc.language.iso en en
dc.title Use of Carbon Micro-particles for improved IR surface temperature measurements of CMOS MEMs Devices en
dc.type Article en
dc.identifier.doi http://dx.doi.org/10.1088/0957-0233/21/4/045107
dc.researchgroup Centre for Electronic and Communications Engineering en


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