Show simple item record

dc.contributor.authorShah, R.
dc.contributor.authorDeSouza, M.
dc.date.accessioned2011-02-01T12:37:21Z
dc.date.available2011-02-01T12:37:21Z
dc.date.issued2010
dc.identifier.citationShah, R. and DeSouza, M. (2010) Surface roughness scattering in MOS structures. Lecture Notes in Electrical Engineering, 60 pp. 117-127en
dc.identifier.isbn9789048187751
dc.identifier.issn1876-1100
dc.identifier.urihttp://hdl.handle.net/2086/4555
dc.language.isoenen
dc.titleSurface roughness scattering in MOS structures.en
dc.typeConferenceen
dc.researchgroupEmerging Technologies Research Centreen
dc.peerreviewedYesen


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following Collection(s)

Show simple item record