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dc.contributor.authorTelleria, R. J.
dc.contributor.authorSilva, F.
dc.contributor.authorOrlandi, A.
dc.contributor.authorSasse, Hugh G.
dc.contributor.authorDuffy, A. P.
dc.date.accessioned2010-08-13T13:21:50Z
dc.date.available2010-08-13T13:21:50Z
dc.date.issued2010
dc.identifier.citationTelleria, R. J. et al (2010) Factors influencing the successful validation of transient phenomenon modelling. Symposium on Electromagnetic Compatibility (APEMC), 2010 Asia-Pacificen
dc.identifier.isbn9781424456215
dc.identifier.urihttp://hdl.handle.net/2086/3978
dc.language.isoenen
dc.publisherIEEEen
dc.titleFactors influencing the successful validation of transient phenomenon modelling.en
dc.typeConferenceen
dc.identifier.doihttp://dx.doi.org/10.1109/APEMC.2010.5475513
dc.researchgroupCentre for Electronic and Communications Engineering
dc.researchgroupCentre for Electronic and Communications Engineering
dc.researchinstituteInstitute of Engineering Sciences (IES)en


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