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dc.contributor.authorDuffy, A. P.
dc.contributor.authorOrlandi, A.
dc.contributor.authorSasse, Hugh G.
dc.date.accessioned2010-02-11T09:14:25Z
dc.date.available2010-02-11T09:14:25Z
dc.date.issued2008
dc.identifier.citationDuffy, A. P., Orlandi, A. and Sasse, H. (2008) Offset difference measure enhancement for the feature-selective validation method. IEEE Transactions on Electromagnetic Compatibillity, 50 (2), pp. 413-415.en
dc.identifier.issn0018-9375
dc.identifier.urihttp://hdl.handle.net/2086/3413
dc.language.isoenen
dc.publisherIEEE Institute of Electrical and Electronicsen
dc.titleOffset difference measure enhancement for the feature-selective validation method.en
dc.typeArticleen
dc.identifier.doihttp://dx.doi.org/10.1109/TEMC.2008.919000
dc.researchgroupCentre for Electronic and Communications Engineering
dc.peerreviewedYesen
dc.ref2014.selected1366964034_9410680002006_15_2
dc.researchinstituteInstitute of Engineering Sciences (IES)en


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