Show simple item record

dc.contributor.authorChoi, Y.en
dc.contributor.authorCollop, Andyen
dc.contributor.authorAirey, G. D.en
dc.contributor.authorElliott, R. C.en
dc.identifier.citationChoi, Y., Collop, A.C., Airey, G.D. and Elliott, R.C. (2005) Effect of Pressure on the Durability of High Modulus Base Material Assessed using the SATS Test. 5th International Conference on Road and Airfield Technology, Seoul, South Koreaen
dc.titleEffect of pressure on the durability of high modulus base material assessed using the SATS Testen
dc.researchinstituteInstitute of Artificial Intelligence (IAI)en

Files in this item


There are no files associated with this item.

This item appears in the following Collection(s)

Show simple item record