Probe propels IR thermal microscopy to a new level

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dc.contributor.author Oxley, C. H. en
dc.contributor.author Hopper, Richard en
dc.contributor.author Prime, Dominic en
dc.contributor.author Leaper, Mark C. en
dc.contributor.author Evans, Gwynne en
dc.contributor.author Levick, Andrew en
dc.date.accessioned 2012-04-03T11:17:20Z
dc.date.available 2012-04-03T11:17:20Z
dc.date.issued 2011
dc.identifier.citation Oxley, C., Hopper, R., Prime, D., Leaper, M., Evans, G. and Levick, A. (2011) Probe propels IR thermal microscopy to a new level, technology. ! IR microscopy, Jan/Feb, 17, pp. 33-36 en
dc.identifier.uri www.compoundsemiconductor.net
dc.identifier.uri http://hdl.handle.net/2086/5868
dc.language.iso en en
dc.title Probe propels IR thermal microscopy to a new level en
dc.type Article en
dc.researchgroup Centre for Electronic and Communications Engineering en
dc.researchgroup Pharmaceutical Technologies
dc.researchgroup Centre for Electronic and Communications Engineering


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