Improved infrared (IR) microscope measurements and theory for the micro-electronics industry.

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dc.contributor.author Oxley, C. H. en
dc.contributor.author Hopper, Richard en
dc.contributor.author Hill, G. en
dc.date.accessioned 2012-01-25T10:18:34Z
dc.date.available 2012-01-25T10:18:34Z
dc.date.issued 2010
dc.identifier.citation Oxley, C.H., Hopper, R.H., Hill, G. and Evans, G.A. (2010) Improved infrared (IR) microscope measurements and theory for the micro-electronics industry. Solid-State Electronics, 54 (1), pp. 63-66 en
dc.identifier.issn 0038-1101
dc.identifier.uri http://hdl.handle.net/2086/5521
dc.language.iso en en
dc.publisher Elsevier en
dc.title Improved infrared (IR) microscope measurements and theory for the micro-electronics industry. en
dc.type Article en
dc.identifier.doi http://dx.doi.org/10.1016/j.sse.2009.09.022
dc.researchgroup Centre for Electronic and Communications Engineering
dc.peerreviewed Yes en


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