Experimental study of mobility degradation in ultrathin high-κ based MOSFETs.

De Montfort University Open Research Archive

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dc.contributor.author Atarah, S. A.
dc.date.accessioned 2010-10-19T14:49:08Z
dc.date.available 2010-10-19T14:49:08Z
dc.date.issued 2010
dc.identifier.citation Atarah, S.A. (2010) Experimental study of mobility degradation in ultrathin high-κ based MOSFETs. Solid State Electronics, 55 (1), pp. 44-48 en
dc.identifier.issn 0038-1101
dc.identifier.uri http://hdl.handle.net/2086/4230
dc.language.iso en en
dc.publisher IEEE en
dc.title Experimental study of mobility degradation in ultrathin high-κ based MOSFETs. en
dc.type Article en
dc.identifier.doi http://dx.doi.org/10.1016/j.sse.2010.09.004
dc.researchgroup Emerging Technologies Research Centre en
dc.peerreviewed Yes en


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