Use of carbon micro-particles for improved infrared temperature measurement of CMOS MEMS devices.

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dc.contributor.author Hopper, Richard
dc.contributor.author Haneef, Ibraheem
dc.contributor.author Ali, Syed Zeeshan
dc.contributor.author Udrea, Florin
dc.contributor.author Oxley, C. H.
dc.date.accessioned 2010-04-09T13:14:41Z
dc.date.available 2010-04-09T13:14:41Z
dc.date.issued 2010-04
dc.identifier.citation Hopper, R.H. et al. (2010) Use of carbon micro-particles for improved infrared temperature measurement of CMOS MEMS devices. Measurement, science and technology, 21 (4), pp. 045107 en
dc.identifier.issn 0957-0233
dc.identifier.uri http://hdl.handle.net/2086/3696
dc.language.iso en en
dc.publisher IOP en
dc.title Use of carbon micro-particles for improved infrared temperature measurement of CMOS MEMS devices. en
dc.type Article en
dc.identifier.doi http://dx.doi.org/10.1088/0957-0233/21/4/045107
dc.researchgroup Centre for Electronic and Communications Engineering


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