Quantifying EMC measurement accuracy using feature selective validation.

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dc.contributor.author Denton, A.
dc.contributor.author Martin, Anthony John Michael
dc.contributor.author Duffy, A. P.
dc.date.accessioned 2010-02-11T09:19:15Z
dc.date.available 2010-02-11T09:19:15Z
dc.date.issued 2008
dc.identifier.citation Denton, A., Martin, A. and Duffy, A. P. (2008) Quantifying EMC measurement accuracy using feature selective validation. Applied Computational Electromagnetics Society Journal, 23 (1), pp. 104-109. en
dc.identifier.issn 1054-4887
dc.identifier.uri http://hdl.handle.net/2086/3417
dc.language.iso en en
dc.publisher Applied Computational Electromagnetics Society Inc. en
dc.title Quantifying EMC measurement accuracy using feature selective validation. en
dc.type Article en
dc.researchgroup Centre for Electronic and Communications Engineering
dc.peerreviewed Yes en


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