Offset difference measure enhancement for the feature-selective validation method.

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dc.contributor.author Duffy, A. P.
dc.contributor.author Orlandi, A.
dc.contributor.author Sasse, Hugh G.
dc.date.accessioned 2010-02-11T09:14:25Z
dc.date.available 2010-02-11T09:14:25Z
dc.date.issued 2008
dc.identifier.citation Duffy, A. P., Orlandi, A. and Sasse, H. (2008) Offset difference measure enhancement for the feature-selective validation method. IEEE Transactions on Electromagnetic Compatibillity, 50 (2), pp. 413-415. en
dc.identifier.issn 0018-9375
dc.identifier.uri http://hdl.handle.net/2086/3413
dc.language.iso en en
dc.publisher IEEE Institute of Electrical and Electronics en
dc.title Offset difference measure enhancement for the feature-selective validation method. en
dc.type Article en
dc.identifier.doi http://dx.doi.org/10.1109/TEMC.2008.919000
dc.researchgroup Centre for Electronic and Communications Engineering
dc.peerreviewed Yes en
dc.ref2014.selected 1366964034_9410680002006_15_2


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