Investigating the stability of zinc oxide thin film transistors.

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dc.contributor.author	Cross, R. B. M.
dc.contributor.author	De Souza, M. M.
dc.date.accessioned	2010-01-28T09:56:43Z
dc.date.available	2010-01-28T09:56:43Z
dc.date.issued	2006
dc.identifier.citation	Cross, R. B. M.; De Souza, M. M. (2006) Investigating the stability of zinc oxide thin film transistors. Applied Physics Letters, 89 (26), p. 263513.	en
dc.identifier.issn	0003-6951
dc.identifier.uri	http://hdl.handle.net/2086/3260
dc.language.iso	en	en
dc.publisher	American Institute of Physics	en
dc.title	Investigating the stability of zinc oxide thin film transistors.	en
dc.type	Article	en
dc.identifier.doi	http://dx.doi.org/10.1063/1.2425020
dc.peerreviewed	Yes	en