Investigating the stability of zinc oxide thin film transistors.

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dc.contributor.author Cross, R. B. M.
dc.contributor.author De Souza, M. M.
dc.date.accessioned 2010-01-28T09:56:43Z
dc.date.available 2010-01-28T09:56:43Z
dc.date.issued 2006
dc.identifier.citation Cross, R. B. M.; De Souza, M. M. (2006) Investigating the stability of zinc oxide thin film transistors. Applied Physics Letters, 89 (26), p. 263513. en
dc.identifier.issn 0003-6951
dc.identifier.uri http://hdl.handle.net/2086/3260
dc.language.iso en en
dc.publisher American Institute of Physics en
dc.title Investigating the stability of zinc oxide thin film transistors. en
dc.type Article en
dc.identifier.doi http://dx.doi.org/10.1063/1.2425020
dc.peerreviewed Yes en


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