dc.contributor.author |
Cross, R. B. M. |
|
dc.contributor.author |
De Souza, M. M. |
|
dc.date.accessioned |
2010-01-28T09:56:43Z |
|
dc.date.available |
2010-01-28T09:56:43Z |
|
dc.date.issued |
2006 |
|
dc.identifier.citation |
Cross, R. B. M.; De Souza, M. M. (2006) Investigating the stability of zinc oxide thin film transistors. Applied Physics Letters, 89 (26), p. 263513. |
en |
dc.identifier.issn |
0003-6951 |
|
dc.identifier.uri |
http://hdl.handle.net/2086/3260 |
|
dc.language.iso |
en |
en |
dc.publisher |
American Institute of Physics |
en |
dc.title |
Investigating the stability of zinc oxide thin film transistors. |
en |
dc.type |
Article |
en |
dc.identifier.doi |
http://dx.doi.org/10.1063/1.2425020 |
|
dc.peerreviewed |
Yes |
en |