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dc.contributor.authorDuffy, A. P.en
dc.contributor.authorOrlandi, A.en
dc.contributor.authorArchambeault, B.en
dc.contributor.authorAntonini, G.en
dc.contributor.authorColeby, D. E.
dc.contributor.authorConnor, S.
dc.date.accessioned2008-11-24T14:02:24Z
dc.date.available2008-11-24T14:02:24Z
dc.date.issued2006-08-01en
dc.identifier.citationDuffy, A.P. et al. (2006) Feature selective validation (FSV) for validation of computational electromagnetics (CEM). Part II - Assessment of FSV performance. IEEE Transactions on Electromagnetic Compatibility, 48(3), pp. 460-467.
dc.identifier.issn0018-9375en
dc.identifier.urihttp://hdl.handle.net/2086/291
dc.description.abstractThe feature selective validation (FSV) method has been proposed as a technique to allow the objective, quantified, comparison of data for inter alia validation of computational electromagnetics. In the companion paper "Feature selective validation for validation of computational electromagnetics. Part I-The FSV method," the method was outlined in some detail. This paper addresses two specific issues related to the implementation of the FSV method, namely "how well does it produce results that agree with visual assessment?" and "what benefit can it provide in a practical validation environment?" The first of these questions is addressed by comparing the FSV output to the results of an extensive survey of EMC engineers from several countries. The second is approached via a case study analysis.
dc.language.isoenen
dc.publisherIEEEen
dc.subjectRAE 2008
dc.subjectUoA 24 Electrical and Electronic Engineering
dc.titleFeature selective validation (FSV) for validation of computational electromagnetics (CEM). Part II -assessment of FSV performanceen
dc.typeArticleen
dc.identifier.doihttps://doi.org/10.1109/TEMC.2006.879360en
dc.researchgroupCentre for Electronic and Communications Engineering
dc.researchinstituteInstitute of Engineering Sciences (IES)en


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